Paper Info
Title
LBIST for Automotive ICs With Enhanced Test Generation
Abstract
Contemporary and emergent automotive systems are heavily populated by complex integrated electronics. The number of safety-critical devices used in advanced driver-assistance systems or autonomous vehicles is growing with high-end models containing hundreds of embedded microcontrollers. Achieving functionally safe automotive electronics requires test solutions that might be costly to engineer. Therefore, to address challenges posed by high-quality and long-term reliability requirements, this article presents low-cost test pattern generation schemes for a scan-based hybrid logic BIST of automotive ICs. It may allow one to optimize test coverage and test time during in-system test applications. The first presented technique deploys a seed-flipping PRPG to periodically complement PRPG stages in a methodical tree-traversal manner. The second scheme is based on a seed-sorting approach that allows additional tradeoffs between test data volume and test coverage. As shown in this article, the proposed schemes can be easily integrated with a test compression environment and deployed in different modes of in-system testing, such as key-off, key-on, and periodic (incremental) online tests. Experimental results obtained for automotive designs and reported herein show improvements in test quality over conventional logic BIST schemes.
Year
DOI
Venue
2022
10.1109/TCAD.2021.3100741
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Keywords
DocType
Volume
Embedded-test,LFSR reseeding,logic built-in self-test (LBIST),scan-based testing,test application time
Journal
41
Issue
ISSN
Citations 
7
0278-0070
0
PageRank 
References 
Authors
0.34
26
7
Name
Order
Citations
PageRank
Bartosz Kaczmarek100.34
Grzegorz Mrugalski200.68
Nilanjan Mukherjee300.68
Artur Pogiel400.34
Janusz Rajski52460201.28
Lukasz Rybak600.34
Jerzy Tyszer783874.98