Name
Abstract | ||
|---|---|---|
In-system deterministic tests are used in safety-sensitive designs to assure high test coverage, short test time, and low data volume, typically through an input-streaming-only approach that allows a quick test delivery. The output side of the same scheme is, however, inherently vulnerable to unknown (X) states whose sources vary from uninitialized memory elements to the last-minute timing violations. Typically, X values degrade test results and thus test response compaction requires some form of protection. This paper presents two X-masking schemes that complement the primary (or level-A) blocking of unknown values by filtering out those X states that escape the first stage of masking and shall not reach a test response compactor or test result sticky-bits deployed by the on-chip compare framework. Experimental results obtained for eleven industrial designs show feasibility and efficiency of the proposed schemes altogether with actual impact of X-masking on various test-related statistics. |
Year | DOI | Venue |
|---|---|---|
2022 | 10.1109/ETS54262.2022.9810407 | 2022 IEEE European Test Symposium (ETS) |
Keywords | DocType | ISSN |
embedded-test,in-system test,scan-based testing,test compression,unknown states,X-masking | Conference | 1530-1877 |
ISBN | Citations | PageRank |
978-1-6654-6707-0 | 0 | 0.34 |
References | Authors | |
18 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Grzegorz Mrugalski | 1 | 0 | 0.68 |
| Janusz Rajski | 2 | 2460 | 201.28 |
| Jerzy Tyszer | 3 | 838 | 74.98 |
| Bartosz Włodarczak | 4 | 0 | 0.34 |