Title
PUF-based Secure Test Wrapper Design for Network-on-Chip
Abstract
Without secure wrappers, it is impossible to protect the integrity of embedded IP cores for NoC-based SoC. This paper describes an IEEE 1500 compatible secure test wrapper NoC based on low-cost PUF circuit. The original key generated by LFSR is encrypted into a stream cipher by the PUF module, and the input key string should be equal to this cryptograph unless the wrapper is locked, which provides effective on-line authentication.
Year
DOI
Venue
2022
10.1109/HOST54066.2022.9840115
2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
Keywords
DocType
ISBN
Test Wrapper,Hardware Security,SoC Testing,Physically Unclonable Functions (PUF),IEEE 1500
Conference
978-1-6654-8533-3
Citations 
PageRank 
References 
0
0.34
6
Authors
6
Name
Order
Citations
PageRank
Ying Zhang116325.25
Yuanxiang Li200.34
Chen Xin3625120.92
Jizhong Yang410.71
Yifeng Hua510.71
Jiaoyan Yao600.34