Title
MPAM: Reliable, Low-Latency, Near-Threshold-Voltage Multi-Voltage/Frequency-Domain Network-on-Chip with Metastability Risk Prediction and Mitigation
Abstract
Emerging applications like a drone and an autonomous vehicle require system-on-a-chips (SoCs) with high reliability, e.g., the mean-time-between-failure (MTBF) needs to be over tens of thousands of hours [1]. Meanwhile, as these applications require increasingly higher performance and energy efficiency, a multi-core architecture is often desirable. Here, each core operates in an independent voltage/frequency (V/F) domain, ideally from the near-threshold voltage (NTV) to super-threshold, while communicating with one another via a network-on-chip (NoC) [2]. However, this makes it challenging to ensure robustness in clock domain crossing against metastability. Metastability becomes even more critical to NTV circuits since metastability resolution time constant <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$T$</tex> grows super-linearly with voltage scaling [3]. Conventionally, an NoC uses multi-stage (4 stages in [4]) synchronizers to improve MTBF, but they increase latency and cannot completely eliminate metastability. Recently, [5] proposed a novel NTV flip-flop, which has a lower probability of having metastability. Another recent work [6] proposed to detect the necessary condition of metastability and mitigate it by modulating the RX clock and also requesting retransmission to guarantee data correctness. However, as it detects a necessary condition, not actual metastability, it tends to overly request retransmission, hurting latency, throughput, and energy efficiency.
Year
DOI
Venue
2022
10.1109/CICC53496.2022.9772849
2022 IEEE Custom Integrated Circuits Conference (CICC)
Keywords
DocType
ISSN
low-latency,metastability risk prediction,system-on-a-chips,mean-time-between-failure,MTBF,energy efficiency,multicore architecture,near-threshold voltage,super-threshold,network-on-chip,clock domain,metastability resolution time,voltage scaling,actual metastability
Conference
0886-5930
ISBN
Citations 
PageRank 
978-1-7281-8280-3
0
0.34
References 
Authors
0
7
Name
Order
Citations
PageRank
Chuxiong Lin101.35
Weifeng He26114.69
Yannan Sun300.34
Lin Shao400.34
Bo Zhang5419.80
Jun Yang614736.54
Mingoo Seok760180.71