Title
Design for Testability That Reduces Linearity Testing Time of SAR ADCs.
Year
DOI
Venue
2011
10.1587/transele.E94.C.1061
IEICE Transactions on Electronics
DocType
Volume
Issue
Journal
94-C
6
ISSN
Citations 
PageRank 
0916-8524
0
0.34
References 
Authors
0
8
Name
Order
Citations
PageRank
Tomohiko Ogawa100.34
Haruo Kobayashi200.68
Satoshi Uemori300.34
Yohei Tan400.34
Satoshi Ito5255.59
Nobukazu Takai600.68
Takahiro J. Yamaguchi752.32
Kiichi Niitsu800.34