Name
Title | Citations | PageRank | Year |
|---|---|---|---|
| Session 3 — Optical interconnect and reliability enhancement techniques | 0 | 0.34 | 2015 |
| Electrical and photonic I/O test and debug | 0 | 0.34 | 2013 |
| Post-Silicon Jitter Measurements | 0 | 0.34 | 2012 |
| Design for Testability That Reduces Linearity Testing Time of SAR ADCs. | 0 | 0.34 | 2011 |
| Static Testing of ADCs Using Wavelet Transforms | 5 | 0.97 | 1997 |