Author Info
Name
Affiliation
Papers
N. MAURAN
LAAS-CNRS, 7 avenue du Colonel Roche, 31077 Cedex 4, Toulouse, France
4
Collaborators
Citations 
PageRank 
15
6
2.64
Referers 
Referees 
References 
28
27
10
Title
Citations
PageRank
Year
20 GHz on-chip measurement of ESD waveform for system level analysis.00.342015
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress.10.382013
An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices30.612012
ESD failure signature in capacitive RF MEMS switches21.322008