Title
20 GHz on-chip measurement of ESD waveform for system level analysis.
Year
Venue
DocType
2015
Microelectronics Reliability
Journal
Volume
Issue
Citations 
55
11
0
PageRank 
References 
Authors
0.34
4
5
Name
Order
Citations
PageRank
Fabrice Caignet1797.99
Nicolas Nolhier242.28
M. Bafleur377.06
A. Wang400.34
N. Mauran562.64