C. Pace - Citegraph

Author Info

Name	Affiliation	Papers
C. PACE	DEIS, University of Calabria, Via Pietro Bucci 42C, 87036 Arcavacata di Rende (CS), Italy	24
Collaborators	Citations	PageRank
56	129	19.43
Referers	Referees	References
414	157	65

Search Limit

100414

Publications (24 rows)

Collaborators (56 rows)

Referers (100 rows)

Referees (100 rows)

Title	Citations	PageRank	Year
A New Effective Methodology for Semiconductor Power Devices HTRB Testing.	0	0.34	2017
A neural network approach for safety monitoring applications	0	0.34	2016
Low Dose-Rate, High Total Dose Set-Up for Rad-Hard CMOS I/O Circuits Testing	0	0.34	2016
Embedded DSP-Based Telehealth Radar System for Remote In-Door Fall Detection	14	0.77	2015
New X-Ray Radiation Sensor for Dosimetry Imaging	0	0.34	2015
A Novel Instrumentation for an Advanced High Temperature Reverse Bias (HTRB) Testing on Power Transistors	0	0.34	2015
Healthcare System for Non-invasive Fall Detection in Indoor Environment	0	0.34	2014
Developments and Applications of Electronic Nose Systems for Gas Mixtures Classification and Concentration Estimation	0	0.34	2014
FPGA-Based Distributed Computing Microarchitecture for Complex Physical Dynamics Investigation	2	0.41	2013
Reconfigurable Implementation of a CNN-UM Platform for Fast Dynamical Systems Simulation.	0	0.34	2013
A 2.6 nW, 0.45 V Temperature-Compensated Subthreshold CMOS Voltage Reference	85	7.83	2011
Full Model and Characterization of Noise in Operational Amplifier	1	0.39	2009
Cross-correlation-based trans-impedance amplifier for current noise measurements	5	0.80	2009
Least square regression method for estimating gas concentration in an electronic nose system.	8	0.79	2009
Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories	0	0.34	2008
On the Use of the SVM Approach in Analyzing an Electronic Nose	2	0.42	2007
Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics	0	0.34	2007
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks	1	0.63	2007
A New Circuit Topology for the Realization of Very Low-Noise Wide-Bandwidth Transimpedance Amplifier	0	0.34	2007
Enhanced sensitivity cross-correlation method for voltage noise measurements	4	0.93	2006
How to enlarge the bandwidth without increasing the noise in OP-AMP-based transimpedance amplifier	3	0.61	2006
Micro-prober for wafer-level low-noise measurements in MOS devices	0	0.34	2003
A new method for high sensitivity noise measurements	4	1.46	2002
True constant temperature MTF test system for the characterization of electromigration of thick Cu interconnection lines	0	0.34	2002