Name
Abstract | ||
|---|---|---|
In this paper, the planning of low dose-rate, high total dose testing campaign for I/O circuits is reported. In particular, the paper describes all development steps, starting from the rad-hard I/O circuits design and the implementation of the test-chip, which is meant to allow comparative testing between rad-hard and standard devices. The designed experimental setup permits in situ measurements, therefore the circuits behavior can be remotely monitored for very long periods. This feature enables low dose-rate testing up to very high dose. |
Year | DOI | Venue |
|---|---|---|
2016 | 10.1007/978-3-319-55071-8_4 | Lecture Notes in Electrical Engineering |
Keywords | DocType | Volume |
Low dose rate,Rad-hard I/O circuits,Radiation effect | Conference | 429 |
ISSN | Citations | PageRank |
1876-1100 | 0 | 0.34 |
References | Authors | |
0 | 6 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| C. Pace | 1 | 129 | 19.43 |
| Letizia Fragomeni | 2 | 0 | 1.01 |
| Aldo Parlato | 3 | 0 | 0.34 |
| Andrea Solano | 4 | 0 | 0.34 |
| Nicolò Marchese | 5 | 0 | 0.34 |
| Daniela Fiore | 6 | 0 | 0.34 |