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CHONG GUN YU
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Name
Affiliation
Papers
CHONG GUN YU
Department of Electronics Engineering, University of Incheon #177 Dohwadong Namgu,Incheon, 402-749, Korea
9
Collaborators
Citations
PageRank
18
4
3.83
Referers
Referees
References
10
17
4
Publications (9 rows)
Collaborators (18 rows)
Referers (10 rows)
Referees (17 rows)
Title
Citations
PageRank
Year
Thermal energy harvesting circuit with maximum power point tracking control for self-powered sensor node applications.
1
0.36
2018
Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory.
0
0.34
2016
Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors.
0
0.34
2016
Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs
0
0.34
2015
Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs.
1
0.63
2014
NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer
1
0.37
2009
Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs
0
0.34
2007
New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors
0
0.34
2006
Increased hot carrier effects in Gate-All-Around SOI nMOSFET’s
1
0.79
2003
1