Author Info
Name
Affiliation
Papers
MOHD FAIRUZ ZAKARIA
Freescale Semiconductor, Selangor, Malaysia
2
Collaborators
Citations 
PageRank 
7
17
1.40
Referers 
Referees 
References 
55
6
2
Title
Citations
PageRank
Year
Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis171.072006
Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST00.342005