Paper Info
Title
Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST
Abstract
Burn-in and stress testing are becoming increasingly important, a sine qua non in the electronics industry as customers become increasingly sensitive to failures occurring in the useful life of a product or system. Burn-in subjects the product to expected field extremes by exposing the product to accelerated temperature and voltages stress to screen infant mortalities (latent failures). In the past, burn in duration studies use constant failure rate statistics to model the classical bathtub curve describing early-life failure behavior of the product throughout its operating lifetime. Thus, FIT (Failure in Time) rate calculations were greatly inflated by including failures occurring long after the time of interest. This manifests in a requirement for a very low failure rate after the conservative burn-in stresses causes the need to sample larger number of units in order to differentiate between the passing and failing criteria. Furthermore, it makes the Burn-In study more complicated and reduces the chance of success.
Year
DOI
Venue
2005
10.1109/ATS.2005.99
Asian Test Symposium
Keywords
Field
DocType
stress testing,statistical analysis,statistics,acceleration,stress,electronics industry,failure rate,voltage,infant mortality,system testing
Computer science,Bathtub curve,System testing,Burn-in,Stress testing,Weibull distribution,Failure rate,Electronic engineering,Accelerated life testing,Statistics,Reliability engineering,Statistical analysis
Conference
ISSN
ISBN
Citations 
1081-7735
0-7695-2481-8
0
PageRank 
References 
Authors
0.34
0
4
Name
Order
Citations
PageRank
Mohd Fairuz Zakaria1171.40
Zainal Abu Kassim2242.24
Melanie Po-Leen Ooi37018.35
Serge N. Demidenko48419.38