Name
Title | ||
|---|---|---|
Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis |
Abstract | ||
|---|---|---|
Editor's note: High-voltage stress testing (HVST) is common in IC manufacturing, but publications comparing it with other test and burn-in methods are scarce. This article shows that the use of HVST can dramatically reduce the amount of required burn-in.--Phil Nigh, IBM Microelectronics |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/MDT.2006.50 | IEEE Design & Test of Computers |
Keywords | Field | DocType |
high-voltage stress test,burn-in time,phil nigh,ic manufacturing,required burn-in,burn-in method,weibull statistical analysis,high-voltage stress testing,ibm microelectronics,statistical analysis,stress testing,weibull analysis,integrated circuit,weibull distribution,normal operator,high voltage | Stress test,Computer science,Burn-in,Stress testing,Weibull distribution,Electronic engineering,Electronics,Ongoing reliability test,High voltage,Reliability engineering,Statistical analysis | Journal |
Volume | Issue | ISSN |
23 | 2 | 0740-7475 |
Citations | PageRank | References |
17 | 1.07 | 2 |
Authors | ||
7 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Mohd Fairuz Zakaria | 1 | 17 | 1.40 |
| Zainal Abu Kassim | 2 | 24 | 2.24 |
| Melanie Po-Leen Ooi | 3 | 70 | 18.35 |
| Serge Demidenko | 4 | 47 | 7.78 |
| ZakariaMohd Fairuz | 5 | 17 | 1.07 |
| KassimZainal Abu | 6 | 17 | 1.07 |
| OoiMelanie Po-Leen | 7 | 17 | 1.07 |