Haeyoung Chung - Citegraph

Author Info

Name	Affiliation	Papers
HAEYOUNG CHUNG	Samsung Electronics, Hwasung-City, Korea	3
Collaborators	Citations	PageRank
43	14	1.76
Referers	Referees	References
54	88	6

Publications (3 rows)

Collaborators (43 rows)

Referers (54 rows)

Referees (88 rows)

Title	Citations	PageRank	Year
An Enhanced Built-off-Test Transceiver with Wide-range, Self-calibration Engine for 3.2 Gb/s/pin DDR4 SDRAM	0	0.34	2018
A 1.2 V 30 nm 3.2 Gb/s/pin 4 Gb DDR4 SDRAM With Dual-Error Detection and PVT-Tolerant Data-Fetch Scheme.	5	0.71	2013
A 1.2V 30nm 3.2Gb/s/pin 4Gb DDR4 SDRAM with dual-error detection and PVT-tolerant data-fetch scheme.	9	0.71	2012

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