Myung-Hoon Yang - Citegraph

Author Info

Name	Affiliation	Papers
MYUNG-HOON YANG	Flash Development Division, Hynix Semiconductor Inc., Gyeonggi-Do, Korea	6
Collaborators	Citations	PageRank
10	13	2.40
Referers	Referees	References
41	127	53

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100127

Publications (6 rows)

Collaborators (10 rows)

Referers (41 rows)

Referees (100 rows)

Title	Citations	PageRank	Year
EOF: Efficient Built-In Redundancy Analysis Methodology With Optimal Repair Rate	4	0.39	2010
Grouped Scan Slice Repetition Method For Reducing Test Data Volume And Test Application Time	2	0.52	2009
XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults	0	0.34	2008
An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme	1	0.36	2008
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR	1	0.35	2008
A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture	5	0.43	2005

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