Name
Title | ||
|---|---|---|
A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture |
Abstract | ||
|---|---|---|
This paper presents a new low power BIST TPG scheme. It uses a transition monitoring window (TMW) that is comprised of a transition monitoring window block and a MUX. When random test patterns are generated by an LFSR, transitions of those patterns satisfy pseudo-random Gaussian distribution. The proposed technique represses transitions of patterns using the k-value which is a standard that is obtained from the distribution of TMW to observe over transitive patterns causing high power dissipation in a scan chain. Experimental results show that the proposed BIST TPG schemes can reduce scan transition by about 60% without performance loss in ISCAS'89 benchmark circuits that have large number scan inputs. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/ATS.2005.12 | Asian Test Symposium |
Keywords | Field | DocType |
pseudo-random gaussian distribution,high power dissipation,new low power test,pattern generator,proposed bist tpg scheme,proposed technique represses transition,transition monitoring window,bist architecture,transition monitoring window block,benchmark circuit,transition monitoring,new low power,bist tpg scheme,random testing,satisfiability,power dissipation,benchmark testing,gaussian distribution | Computer science,Dissipation,Scan chain,Multiplexer,Electronic engineering,Real-time computing,Test pattern generators,Gaussian,Electronic circuit,Benchmark (computing),Built-in self-test | Conference |
ISSN | ISBN | Citations |
1081-7735 | 0-7695-2481-8 | 5 |
PageRank | References | Authors |
0.43 | 13 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Youbean Kim | 1 | 11 | 2.48 |
| Myung-Hoon Yang | 2 | 13 | 2.40 |
| Yong Lee | 3 | 5 | 0.43 |
| Sungho Kang | 4 | 436 | 78.44 |