Name
Title | ||
|---|---|---|
Grouped Scan Slice Repetition Method For Reducing Test Data Volume And Test Application Time |
Abstract | ||
|---|---|---|
This paper presents a grouped scan slice encoding technique using scan slice repetition to simultaneously reduce test data volume and test application time. Using this method, many scan slices that Would be incompatible with the conventional selective scan slice method can be encoded as compatible scan slices. Experiments were performed with IS-CAS'89 and ITC'99 benchmark circuits. and results show the effectiveness of the proposed method. |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1587/transinf.E92.D.1462 | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS |
Keywords | Field | DocType |
design for testability (DfT), scan testing, test data compression | Design for testing,Wafer,Computer vision,Pattern recognition,Computer science,Coding (social sciences),Test data compression,Test data,Artificial intelligence,Electronic circuit,Data compression,Encoding (memory) | Journal |
Volume | Issue | ISSN |
E92D | 7 | 1745-1361 |
Citations | PageRank | References |
2 | 0.52 | 4 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yong-Joon Kim | 1 | 118 | 13.73 |
| Myung-Hoon Yang | 2 | 13 | 2.40 |
| Jaeseok Park | 3 | 19 | 6.05 |
| Eunsei Park | 4 | 2 | 0.52 |
| Sungho Kang | 5 | 436 | 78.44 |