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YANN WEBER
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Name
Affiliation
Papers
YANN WEBER
CNRS, Univ. de Toulouse, Toulouse
7
Collaborators
Citations
PageRank
21
1
2.51
Referers
Referees
References
3
71
19
Publications (7 rows)
Collaborators (21 rows)
Referers (3 rows)
Referees (71 rows)
Title
Citations
PageRank
Year
Mechanisms of power module source metal degradation during electro-thermal aging.
0
0.34
2017
In-depth investigation of metallization aging in power MOSFETs
0
0.34
2015
General linearized model use for High Power Reliability Assessment test results: Conditions, procedure and case study.
0
0.34
2015
Signal noise perturbation on automotive mixed-mode semiconductor device generated by graded substrate defect.
0
0.34
2014
Detectability of automotive power MOSFET on-resistance failure at high current induced by Wafer Fab process excursion.
0
0.34
2013
Mechanism of breakdown voltage wavering in power MOSFET induced by silicon crystalline defect.
1
0.48
2011
Characterisation of P floating islands for 150-200 V FLYMOSFETs.
0
0.34
2007
1