Author Info
Name
Papers
Collaborators
KOICHI ITAYA
2
10
Citations 
PageRank 
Referers 
33
2.00
86
Referees 
References 
65
19
Title
Citations
PageRank
Year
BIST-Aided Scan Test - A New Method for Test Cost Reduction331.662003
ATREX: Design for Testability System for Mega Gate LSIs00.341997