Name
Abstract | ||
|---|---|---|
We propose a Design for Testability System for Mega Gate LSIs. This system meets various demands of designers, because this system has high flexibility. We show the flexibility by introducing some example of circuit insertion which is supported by the system. |
Year | DOI | Venue |
|---|---|---|
1997 | 10.1109/ATS.1997.643947 | Asian Test Symposium |
Keywords | Field | DocType |
mega gate lsis,high flexibility,testability system,various demand,circuit insertion,logic design,design for testability,logic circuits,design methodology,logic gates | Logic synthesis,Design for testing,Logic gate,Logic testing,Computer science,Automatic testing,Electronic engineering,Design methods,ATREX,Mega- | Conference |
ISBN | Citations | PageRank |
0-8186-8209-4 | 0 | 0.34 |
References | Authors | |
4 | 6 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Michiaki Emori | 1 | 44 | 3.53 |
| Junko Kumagai | 2 | 0 | 0.34 |
| Koichi Itaya | 3 | 33 | 2.00 |
| Takashi Aikyo | 4 | 93 | 11.46 |
| Tomoko Anan | 5 | 0 | 0.34 |
| Junichi Niimi | 6 | 0 | 0.34 |