Author Info
Name
Affiliation
Papers
H. NOHIRA
Department of Electrical and Electronic Engineering, Musashi Institute of Technology, 1-28-1 Setagaya-ku, Tokyo 158-8557, Japan
2
Collaborators
Citations 
PageRank 
17
0
0.68
Referers 
Referees 
References 
0
12
2
Title
Citations
PageRank
Year
SrO capping effect for La2O3/Ce-silicate gate dielectrics00.342010
Angle-resolved photoelectron spectroscopy on gate insulators00.342007