Author Info
Name
Affiliation
Papers
ERIC KWANG JOO SIM
Monash Univ, Petaling Jaya 46150, Selangor, Malaysia
2
Collaborators
Citations 
PageRank 
7
2
0.75
Referers 
Referees 
References 
7
42
17
Title
Citations
PageRank
Year
Identifying Systematic Failures on Semiconductor Wafers Using ADCAS.00.342013
Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction.20.412011