Name
Year | DOI | Venue |
|---|---|---|
2013 | 10.1109/MDAT.2013.2253151 | IEEE DESIGN & TEST |
Keywords | Field | DocType |
Automatic test equipment,Systematics,Clustering algorithms,Accuracy,Analysis of variance,Classification algorithms,Training | Semiconductor technology,Automatic test equipment,Computer science,Intuition,Electronic engineering,Statistical classification,Computer engineering,Root cause,Reliability engineering | Journal |
Volume | Issue | ISSN |
30 | 5 | 2168-2356 |
Citations | PageRank | References |
0 | 0.34 | 4 |
Authors | ||
7 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Melanie Po-Leen Ooi | 1 | 70 | 18.35 |
| Hong Kuan Sok | 2 | 15 | 1.80 |
| Ye Chow Kuang | 3 | 72 | 19.81 |
| Huiyuan Cheng | 4 | 0 | 0.68 |
| Eric Kwang Joo Sim | 5 | 2 | 0.75 |
| Serge N. Demidenko | 6 | 84 | 19.38 |
| Chris W. K. Chan | 7 | 2 | 0.75 |