1/F-Noise Characteristics In 100 Nm-Mosfets And Its Modeling For Circuit Simulation | 0 | 0.34 | 2005 |
A test structure for two-dimensional analysis of MOSFETs by hot-carrier-induced photoemission | 0 | 0.34 | 2005 |
A Compact Model Of The Pinch-Off Region Of 100 Nm Mosfets Based On The Surface-Potential | 0 | 0.34 | 2005 |
Circuit Simulation Models For Coming Mosfet Generations | 0 | 0.34 | 2002 |
Correlation method of circuit-performance and technology fluctuations for improved design reliability | 1 | 0.39 | 2001 |