| Radiation effects in nitride read-only memories | 0 | 0.34 | 2010 |
| Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage | 5 | 0.56 | 2007 |
| Structure of the oxide damage under progressive breakdown | 1 | 0.52 | 2005 |
| Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric | 0 | 0.34 | 2005 |
