Author Info
Name
Affiliation
Papers
C. ZHAO
Inst. Microelectronics of Chinese Academy Sciences, Beijing 100029, PR China
4
Collaborators
Citations 
PageRank 
32
5
2.11
Referers 
Referees 
References 
25
16
3
Title
Citations
PageRank
Year
Interfacial property tuning of heavy metal/CoFeB for large density STT-MRAM00.342017
Charge pumping test technique using CMOS ring oscillator on leakage issue.00.342017
Overshoot stress impact on HfO2 high-κ layer dynamic SILC00.342015
Processing assessment and adhesion evaluation of copper through-silicon vias (TSVs) for three-dimensional stacked-integrated circuit (3D-SIC) architectures51.092010