Author Info
Name
Affiliation
Papers
JEFFREY LAM
Product, test and failure analysis, GLOBALFOUNDRIES Singapore Pte. Ltd, 60 Woodlands, Industrial Park D Street 2, Singapore 738406, Singapore
4
Collaborators
Citations 
PageRank 
16
1
1.64
Referers 
Referees 
References 
10
26
8
Title
Citations
PageRank
Year
Solving 28 nm I/O circuit reliability issue due to IC design weakness.00.342018
In-depth circuits edit analysis to reveal the implantation-related defect.00.342017
Concurrent built-in self-testing under the constraint of shared test resources and its test time reduction.00.342017
Static fault localization of subtle metallization defects using near infrared photon emission microscopy.10.632017