| Comments on "Sources of failures and yield improvement for VLSI and restructurable interconnects for RVLSI and WSI: Part I—Sources of failures and yield improvement for VLSI" | 26 | 5.24 | 1986 |
| Fault-Tolerant Design for VLSI: Effect of Interconnect Requirements on Yield Improvement of VLSI Designs | 49 | 7.12 | 1982 |
