Author Info
Name
Affiliation
Papers
N. GOEL
Department of Electrical EngineeringIndian Institute of Technology BombayMumbai400076India
2
Collaborators
Citations 
PageRank 
7
12
1.92
Referers 
Referees 
References 
58
51
14
Title
Citations
PageRank
Year
Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltages40.502015
A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs.81.422014