Author Info
Name
Affiliation
Papers
YING-YEN CHEN
Realtek Semiconductor Corporation, Taiwan
2
Collaborators
Citations 
PageRank 
13
1
0.73
Referers 
Referees 
References 
4
19
4
Title
Citations
PageRank
Year
A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement.00.342018
Predicting Vt mean and variance from parallel Id measurement with model-fitting technique10.402016