Name
Title | ||
|---|---|---|
A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement. |
Year | Venue | DocType |
|---|---|---|
2018 | IEEE Trans. on CAD of Integrated Circuits and Systems | Journal |
Volume | Issue | Citations |
37 | 10 | 0 |
PageRank | References | Authors |
0.34 | 0 | 10 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Chien-Hsueh Lin | 1 | 1 | 0.73 |
| Chih-Ying Tsai | 2 | 1 | 0.73 |
| Kao-Chi Lee | 3 | 1 | 0.73 |
| Sung-Chu Yu | 4 | 0 | 0.34 |
| Wen-Rong Liau | 5 | 0 | 0.68 |
| Alex Chun-Liang Hou | 6 | 0 | 0.34 |
| Ying-Yen Chen | 7 | 1 | 0.73 |
| Chun-Yi Kuo | 8 | 5 | 1.14 |
| Jih-Nung Lee | 9 | 0 | 0.68 |
| Mango C.-T. Chao | 10 | 48 | 7.38 |