| New topic session 2B: Co-design and reliability of power electronic modules — Current status and future challenges | 0 | 0.34 | 2014 |
| New topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensors. | 0 | 0.34 | 2014 |
| On-chip testing of embedded silicon transducers | 1 | 0.36 | 2004 |
| Frequency-based BIST for analog circuit testing | 12 | 1.50 | 1995 |
