Author Info
Name
Affiliation
Papers
ZHIHENG LIAO
Institute of Semiconductor Device Reliability Physics, Beijing University of Technology, Beijing 100124, China
7
Collaborators
Citations 
PageRank 
28
2
2.39
Referers 
Referees 
References 
10
19
6
Title
Citations
PageRank
Year
Improving DNN Fault Tolerance using Weight Pruning and Differential Crossbar Mapping for ReRAM-based Edge AI20.362021
Ameliorate Performance of Memristor-Based ANNs in Edge Computing00.342021
Memristor-Based Neuromorphic Hardware Improvement for Privacy-Preserving ANN00.342019
Mitigating Nonlinear Effect of Memristive Synaptic Device for Neuromorphic Computing00.342019
Linear Optimization for Memristive Device in Neuromorphic Hardware00.342019
Influence of heat source size on thermal resistance of AlGaN/GaN HEMT00.342017
Thermal evaluation of GaN-based HEMTs with various layer sizes and structural parameters using finite-element thermal simulation.00.342017