Ronald D. Blanton - Citegraph

Author Info

Name	Affiliation	Papers
RONALD D. BLANTON	Carnegie Mellon Univ, Dept Elect & Comp Engn, Adv Chip Testing Lab, Pittsburgh, PA 15213 USA	23
Collaborators	Citations	PageRank
42	253	26.57
Referers	Referees	References
448	565	276

Search Limit

100565

Publications (23 rows)

Collaborators (42 rows)

Referers (100 rows)

Referees (100 rows)

Title	Citations	PageRank	Year
Characterization of Locked Sequential Circuits via ATPG	1	0.36	2019
Back-End Layout Reflection for Test Chip Design	0	0.34	2018
A Learning-Based Approach to Secure JTAG Against Unseen Scan-Based Attacks.	0	0.34	2016
Special session: Hot topics: Statistical test methods	0	0.34	2015
Efficient built-in self test of regular logic characterization vehicles	3	0.43	2015
Improving accuracy of on-chip diagnosis via incremental learning	3	0.39	2015
Statistical Learning in Chip (SLIC)	1	0.36	2015
PADRE: Physically-Aware Diagnostic Resolution Enhancement	7	0.53	2013
Slider: A Fast And Accurate Defect Simulation Framework	5	0.50	2011
Systematic defect identification through layout snippet clustering	18	0.90	2010
Automatic classification of bridge defects	9	0.57	2010
Estimating Defect-Type Distributions Through Volume Diagnosis And Defect Behavior Attribution	10	0.63	2010
Test Effectiveness Evaluation Through Analysis Of Readily-Available Tester Data	2	0.37	2009
An Effective And Flexible Multiple Defect Diagnosis Methodology Using Error Propagation Analysis	22	0.82	2008
Improving The Accuracy Of Test Compaction Through Adaptive Test Update	1	0.38	2008
A Logic Diagnosis Methodology For Improved Localization And Extraction Of Accurate Defect Behavior	54	2.15	2006
Diagnostic Test Generation For Arbitrary Faults	19	0.99	2006
Fault Tuples in Diagnosis of Deep-Submicron Circuits	16	0.76	2002
False coupling interactions in static timing analysis	17	1.02	2001
MEMS fault model generation using CARAMEL	8	2.15	1998
Failure modes for stiction in surface-micromachined MEMS	9	2.50	1998
To DFT or Not to DFT?	20	3.29	1997
Development of a MEMS testing methodology	28	6.47	1997