Author Info
Name
Affiliation
Papers
SIMON THOMANN
Karlsruhe Institute of Technology, Chair for Embedded Systems (CES), Karlsruhe, Germany
6
Collaborators
Citations 
PageRank 
23
5
2.20
Referers 
Referees 
References 
26
38
11
Title
Citations
PageRank
Year
Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks00.342021
Cross-layer Design for Computing-in-Memory: From Devices, Circuits, to Architectures and Applications00.342021
On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM20.422021
Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology10.362020
BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array – including Sense Amplifiers and Write Drivers – under Processor Activity10.362020
Reliability Challenges with Self-Heating and Aging in FinFET Technology10.382019