Name
Year | DOI | Venue |
|---|---|---|
2012 | 10.1109/MDT.2012.2206009 | IEEE DESIGN & TEST OF COMPUTERS |
Keywords | Field | DocType |
ageing,negative bias temperature instability | Computer science,Fault detection and isolation,Electronic engineering,Negative-bias temperature instability,Electronic circuit | Journal |
Volume | Issue | ISSN |
29 | 5 | 0740-7475 |
Citations | PageRank | References |
5 | 0.44 | 6 |
Authors | ||
9 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jackson Pachito | 1 | 5 | 0.44 |
| Celestino V. Martins | 2 | 16 | 1.21 |
| B. Jacinto | 3 | 5 | 0.44 |
| Jorge Semião | 4 | 57 | 12.11 |
| Julio César Vázquez | 5 | 36 | 3.27 |
| Víctor H. Champac | 6 | 125 | 25.19 |
| Marcelino B. Santos | 7 | 129 | 20.76 |
| Isabel C. Teixeira | 8 | 42 | 8.70 |
| João Paulo Teixeira | 9 | 140 | 22.06 |