Name
Title | ||
|---|---|---|
A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing. |
Abstract | ||
|---|---|---|
This paper proposes a new method for measuring aperture jitter on an ADC output. It measures both the average ENOB loss and the worst-case ENOB loss due to aperture jitter Because it adds only a negligible computation time to an existing ENOB test, it can also be used in an HV production environment without significantly increasing the overall test time. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1109/TEST.2008.4700639 | ITC |
Keywords | Field | DocType |
analogue-digital conversion,jitter,ADC output,ENOB loss,ENOB testing,HV production environment,aperture jitter | Aperture,Noise measurement,Computer science,Development environment,Signal-to-noise ratio,Effective number of bits,Electronic engineering,Aperture jitter,Jitter,Electrical engineering,Computation | Conference |
ISSN | Citations | PageRank |
1089-3539 | 7 | 0.67 |
References | Authors | |
9 | 6 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Takahiro J. Yamaguchi | 1 | 176 | 35.24 |
| Masayuki Kawabata | 2 | 17 | 4.61 |
| Mani Soma | 3 | 497 | 73.41 |
| Masahiro Ishida | 4 | 105 | 22.58 |
| K. Sawami | 5 | 7 | 0.67 |
| Koichiro Uekusa | 6 | 11 | 2.35 |