Koichiro Uekusa - Citegraph

Author Info

Name	Affiliation	Papers
KOICHIRO UEKUSA	Advantest Labs Ltd, Sendai, Miyagi, Japan	5
Collaborators	Citations	PageRank
19	11	2.35
Referers	Referees	References
41	30	15

Publications (5 rows)

Collaborators (19 rows)

Referers (41 rows)

Referees (30 rows)

Title	Citations	PageRank	Year
Photonic Integrated Circuit Using Lanthanum-Modified Lead Zirconate Titanate Thin Films	0	0.34	2017
A new method for measuring alias-free aperture jitter in an ADC output	0	0.34	2015
A Self-Calibration Technique For Capacitor Mismatch Errors Of An Interleaved Sar Adc	2	0.44	2010
A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing.	7	0.67	2008
Hts Sampler With Improved Circuit Design And Layout	2	0.56	2007

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