Name
Title | ||
|---|---|---|
Simulation-based target test generation techniques for improving the robustness of a software-based-self-test methodology. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/TEST.2005.1584059 | ITC |
Keywords | Field | DocType |
fault coverage,chip,automatic test pattern generation,reduced instruction set computing,robustness,random testing,functional testing | Automatic test pattern generation,Test method,Fault coverage,Computer science,Real-time computing,Robustness (computer science),Reduced instruction set computing,Software,Boolean algebra,Computer engineering,Built-in self-test | Conference |
Citations | PageRank | References |
6 | 0.55 | 12 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Charles H.-P. Wen | 1 | 97 | 20.17 |
| Li-C. Wang | 2 | 201 | 17.53 |
| Kwang-Ting Cheng | 3 | 5755 | 513.90 |
| Wei-Ting Liu | 4 | 18 | 1.77 |
| Ji-Jan Chen | 5 | 116 | 9.34 |