Name
Abstract | ||
|---|---|---|
The presence of unknown values in simulation is the greatest barrier to effective test response compaction. For space compactors, some responses may not be observable due to the masking effect caused by unknown values. This paper reports on experiments conducted to evaluate the impact on the test quality of various percentages of observable responses for both modeled and un-modeled faults. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/DATE.2006.243930 | DATE |
Keywords | Field | DocType |
national electric code,value engineering,fault detection,compaction,automatic test pattern generation,benchmark testing | Automatic test pattern generation,Observable,Masking (art),Logic testing,Computer science,Test quality,Value engineering,Real-time computing,Compaction,Reliability engineering | Conference |
Volume | ISSN | ISBN |
1 | 1530-1591 | 3-9810801-0-6 |
Citations | PageRank | References |
0 | 0.34 | 5 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Mango C.-T. Chao | 1 | 48 | 7.38 |
| Seongmoon Wang | 2 | 605 | 48.50 |
| Srimat T. Chakradhar | 3 | 2492 | 185.94 |
| Wenlong Wei | 4 | 81 | 6.50 |
| Kwang-Ting Cheng | 5 | 5755 | 513.90 |