Name
Title | ||
|---|---|---|
Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation. |
Abstract | ||
|---|---|---|
Résumé We present a methodology for precise measurements and simulations of ESD system level stress applied to a simple printed circuit board. The impact of an external decoupling capacitance on the ESD propagation paths into an Integrated Circuit (IC) is demonstrated. Resulting current and voltage waveforms are analyzed to highlight the interactions between IC and components (including package, PCB and ESD protections). |
Year | DOI | Venue |
|---|---|---|
2013 | 10.1016/j.microrel.2012.04.012 | Microelectronics Reliability |
Keywords | Field | DocType |
electrostatic discharge,integrated circuits,printed circuits,ESD propagation,ESD protections,ESD system level stress,IC,PCB,current waveforms,decoupling capacitance,printed circuit board,system level ESD modeling,voltage waveforms | Capacitance,Electrostatic discharge,Voltage,Waveform,Decoupling (cosmology),Printed circuit board,Electronic engineering,Engineering,Electrical engineering,Integrated circuit,System level | Journal |
Volume | Issue | ISSN |
53 | 2 | 0026-2714 |
ISBN | Citations | PageRank |
978-1-58537-182-2 | 1 | 0.48 |
References | Authors | |
1 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Nicolas Monnereau | 1 | 1 | 0.48 |
| Fabrice Caignet | 2 | 79 | 7.99 |
| David Trémouilles | 3 | 13 | 8.69 |
| Nicolas Nolhier | 4 | 4 | 2.28 |
| M. Bafleur | 5 | 7 | 7.06 |