Author Info
Name
Affiliation
Papers
M. BAFLEUR
CNRS, LAAS, 7 avenue du colonel Roche, F-31077 Toulouse, France
18
Collaborators
Citations 
PageRank 
49
7
7.06
Referers 
Referees 
References 
46
54
14
Title
Citations
PageRank
Year
Energy-Harvesting Powered Variable Storage Topology For Battery-Free Wireless Sensors00.342018
Single Piezoelectric Transducer as Strain Sensor and Energy Harvester Using Time-Multiplexing Operation.10.362017
Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis.00.342017
Prediction of LIN communication robustness against EFT events using dedicated failure models.00.342017
New triggering-speed-characterization method for diode-triggered SCR using TLP.00.342017
Impact of non-linear capacitances on transient waveforms during system level ESD stress.00.342016
20 GHz on-chip measurement of ESD waveform for system level analysis.00.342015
Optimization of a MOS–IGBT–SCR ESD protection component in smart power SOI technology00.342015
Reliability of ESD protection devices designed in a 3D technology.00.342014
Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation.10.482013
Towards Energy Autonomy of Wireless Sensors in Aeronautics Applications: SMARTER Collaborative Project.10.372013
Comparative study of sensitive volume and triggering criteria of SEB in 600 V planar and trench IGBTs.10.442011
MOS-IGBT power devices for high-temperature operation in smart power SOI technology.00.342011
Potentialities of substrate-thinning technique to control minority carrier injection in smart power IC's00.342006
Study of the ESD defects impact on ICs reliability.10.632004
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.20.742004
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology00.342003
In the memory of Georges Charitat00.342002