Nicolas Nolhier - Citegraph

Author Info

Name	Affiliation	Papers
NICOLAS NOLHIER	CNRS, LAAS, 7 avenue du colonel Roche, F-31077 Toulouse, France	5
Collaborators	Citations	PageRank
16	4	2.28
Referers	Referees	References
30	15	9

Publications (5 rows)

Collaborators (16 rows)

Referers (30 rows)

Referees (15 rows)

Title	Citations	PageRank	Year
20 GHz on-chip measurement of ESD waveform for system level analysis.	0	0.34	2015
Reliability of ESD protection devices designed in a 3D technology.	0	0.34	2014
Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation.	1	0.48	2013
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress.	1	0.38	2013
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.	2	0.74	2004

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