Nick van der Meijs - Citegraph

Author Info

Name	Affiliation	Papers
NICK VAN DER MEIJS	Delft Univ Technol, Delft, Netherlands	19
Collaborators	Citations	PageRank
25	30	7.49
Referers	Referees	References
53	369	213

Search Limit

100369

Publications (19 rows)

Collaborators (25 rows)

Referers (53 rows)

Referees (100 rows)

Title	Citations	PageRank	Year
Statistical Transistor-Level Timing Analysis Using a Direct Random Differential Equation Solver	1	0.37	2014
A 0.1pJ Freeze Vernier time-to-digital converter in 65nm CMOS	0	0.34	2014
Considering Crosstalk Effects in Statistical Timing Analysis	0	0.34	2014
Dynamic Thermal Estimation Methodology for High-Performance 3-D MPSoC	3	0.41	2014
Balanced stochastic truncation of coupled 3D interconnect	0	0.34	2013
Adaptive Thermal Monitoring Of Deep-Submicron Cmos Vlsi Circuits	0	0.34	2013
Thermal analysis of 3D integrated circuits based on discontinuous Galerkin finite element method	5	0.43	2012
A 11 µW 0°C–160°C temperature sensor in 90 nm CMOS for adaptive thermal monitoring of VLSI circuits	0	0.34	2012
Transistor-level gate model based statistical timing analysis considering correlations	2	0.35	2012
Crosstalk-aware statistical interconnect delay calculation	2	0.38	2012
Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs	6	0.82	2011
Enhanced Sensitivity Computation For Bem Based Capacitance Extraction Using The Schur Complement Technique	0	0.34	2011
Noise analysis of non-linear dynamic integrated circuits	0	0.34	2010
RDE-based transistor-level gate simulation for statistical static timing analysis	5	0.46	2010
Transistor-level gate modeling for nano CMOS circuit verification considering statistical process variations	0	0.34	2010
Digital cartesian feedback linearization of switched mode power amplifiers	0	0.34	2010
Statistical Moment Estimation Of Delay And Power In Circuit Simulation	1	0.38	2010
A Radix 22 based parallel pipeline FFT processor for MB-OFDM UWB system	1	0.35	2009
Sensitivity computation using domain-decomposition for boundary element method based capacitance extractors	4	0.49	2009

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