Title
A 1.2 V 12.8 GB/s 2 Gb Mobile Wide-I/O DRAM With 4 × 128 I/Os Using TSV Based Stacking.
Abstract
A 1.2 V 1 Gb mobile SDRAM, having 4 channels with 512 DQ pins has been developed with 50 nm technology. It exhibits 330.6 mW read operating power during 4 channel operation, achieving 12.8 GB/s data bandwidth. Test correlation techniques to verify functions through micro bumps and test pads have been developed. Block based dual period refresh scheme is applied to reduce self refresh current with m...
Year
DOI
Venue
2012
10.1109/JSSC.2011.2164731
IEEE Journal of Solid-State Circuits
Keywords
DocType
Volume
Random access memory,Through-silicon vias,SDRAM,DRAM chips,Silicon,CMOS memory circuits,CMOS integrated circuits
Journal
47
Issue
ISSN
Citations 
1
0018-9200
75
PageRank 
References 
Authors
6.09
4
22
Name
Order
Citations
PageRank
Jung-Sik Kim113811.69
Chi Sung Oh2938.94
Hocheol Lee3877.45
Dong-Hyuk Lee4125448.26
Hyong-Ryol Hwang5826.94
Sooman Hwang6826.61
Byongwook Na7837.99
Joungwook Moon8837.66
Jin-Guk Kim9959.18
Hanna Park10826.94
Jang-Woo Ryu11826.61
Kiwon Park12877.77
Sang-Kyu Kang1314212.20
Soyoung Kim1416822.15
Hoyoung Kim1513412.78
Jong-Min Bang16826.94
Hyunyoon Cho1711010.56
Min-Soo Jang189711.05
Cheolmin Han19826.61
Jung-Bae Lee2017917.70
Joo-Sun Choi2124629.16
Young-Hyun Jun22756.09