Name
Title | ||
|---|---|---|
Modeling the Probability of Defect Excitation for a Commercial IC with Implications for Stuck-at Fault-Based ATPG Strategies |
Abstract | ||
|---|---|---|
If many potential defects exist at each site in an integratedcircuit, then as the number of applied test patternsincreases, the number of defects which remain undetecteddecreases monotonically. Modeling this rate of decline indefective part level is a non-trivial problem. We show thatthe number of times each site is observed serves as a significantlysuperior basis for modeling this phenomenonwhen contrasted with the number of faults detected. This"site observation-based" predictor not only increases theaccuracy of defective part level prediction, it also providesthe first quantitative method for comparing the effectivenessof various ATPG strategies to reduce the defectivepart level. |
Year | DOI | Venue |
|---|---|---|
1999 | 10.1109/TEST.1999.805836 | ITC |
Keywords | DocType | ISBN |
commercial ic,quantitative method,applied test patternsincreases,defect excitation,non-trivial problem,decline indefective part level,stuck-at fault-based atpg strategies,significantlysuperior basis,defectivepart level,effectivenessof various atpg strategy,potential defect,thatthe number,defective part level prediction,fault coverage,probability,automatic test pattern generation,fault detection,yield,pattern analysis | Conference | 0-7803-5753-1 |
Citations | PageRank | References |
6 | 0.80 | 2 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jennifer Dworak | 1 | 132 | 11.63 |
| Michael R. Grimaila | 2 | 264 | 29.53 |
| Sooryong Lee | 3 | 87 | 7.63 |
| Li-C. Wang | 4 | 527 | 50.67 |
| M. Ray Mercer | 5 | 679 | 108.73 |