Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults | 4 | 0.56 | 2002 |
Defect-Oriented Testing and Defective-Part-Level Prediction | 33 | 2.08 | 2001 |
Enhanced DO-RE-ME Based Defect Level Prediction Using Defect Site Aggregation-MPG-D | 19 | 1.25 | 2000 |
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experiment | 25 | 2.94 | 1999 |
Modeling the Probability of Defect Excitation for a Commercial IC with Implications for Stuck-at Fault-Based ATPG Strategies | 6 | 0.80 | 1999 |