Name
Abstract | ||
|---|---|---|
This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually and then combined using Matlab. The Matlab simulation shows how jitter components combine and how the total jitter depends on the jitter injection sequence. The relationship among jitter components is presented and the superposition of the jitter components is verified. This new technique gives test engineers an insight into how the jitter components interact. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/DFTVS.2005.52 | DFT |
Keywords | Field | DocType |
new jitter component analysis,automatic test equipment,mixed mode,total jitter,vlsi chip testing,jitter injection sequence,jitter component,matlab simulation,new technique,jitter components interact,vlsi,jitter,electromagnetic interference,gaussian distribution,flicker noise,chip | Superposition principle,MATLAB,Computer science,Automatic test equipment,Electronic engineering,Real-time computing,Mixed mode,Jitter,Computer hardware,Component analysis,Very-large-scale integration,Matlab simulation | Conference |
ISSN | ISBN | Citations |
1550-5774 | 0-7695-2464-8 | 4 |
PageRank | References | Authors |
0.80 | 4 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kyung Ki Kim | 1 | 99 | 21.62 |
| Jing Huang | 2 | 94 | 10.93 |
| Yong-bin Kim | 3 | 338 | 55.72 |
| Fabrizio Lombardi | 4 | 1985 | 259.25 |