Name
Title | ||
|---|---|---|
Temperature-dependent noise characterization and modeling of on-wafer microwave transistors |
Abstract | ||
|---|---|---|
Thermal investigation is of basic importance to assess key aspects of the performance and the reliability of microwave devices and circuits operating in a critical environment. To this aim, we have designed and realized an efficient thermoelectric chuck for on-wafer probe stations featuring rapid and accurate temperature control over the 220–320 K range. The system has been exploited in the measurement of I–V characteristics, scattering parameters and noise figure of GaAs-based heterojunction devices up to 40 GHz. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1016/S0026-2714(02)00004-5 | Microelectronics Reliability |
Keywords | DocType | Volume |
measurement system,noise figure,temperature control,semiconductor devices | Journal | 42 |
Issue | ISSN | Citations |
3 | 0026-2714 | 3 |
PageRank | References | Authors |
2.22 | 1 | 2 |